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Research unit
INNOSUISSE
Project number
12874.1;11 PFNM-NM
Project title
Advanced localized nano-characterization of wafer fused-VCSELs for device failure analysis

Participants

Research organisation: Innosuisse
Swiss Innovation Agency
Einsteinstrasse 2
CH-3003 Bern
+41 58 461 61 61 (Call Center)
info@innosuisse.ch
www.innosuisse.ch/
Contact person

 Prof.
Eli Kapon
Swiss Federal Institute of Technolo
EPFL
PH D3 425 BAT.PH, STATION 3
CH-1015 Lausanne
eli.kapon@epfl.ch