A caesium deposition system for FIB-SIMS chemical imaging

• Unité de recherche: INNOSUISSE
• Numéro de projet: 17140.1 PFNM-NM
• Titre du projet anglais: A caesium deposition system for FIB-SIMS chemical imaging

Description succincte (Allemand)

A caesium deposition system for FIB-SIMS chemical imaging

Description succincte (Anglais)

A caesium deposition system for FIB-SIMS chemical imaging

Résumé des résultats (Abstract) (Allemand)

The project will bring to commercial readiness a device to greatly increase the magnitude of signals from a secondary ion mass spectrometer mounted on a focused ion beam microscope. This will be achieved by depositing a layer of caesium on the sample within the vacuum system as measurements are carried out. Increased sensitivity  will enhance the sales of Tofwerk's existing FIB-SIMS product for chemical imaging at nano scales in three dimensions.

Résumé des résultats (Abstract) (Anglais)