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Research unit
INNOSUISSE
Project number
17140.1 PFNM-NM
Project title
A caesium deposition system for FIB-SIMS chemical imaging

Texts for this project
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Short description
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Abstract
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Inserted texts


CategoryText
Short description
(German)
A caesium deposition system for FIB-SIMS chemical imaging
Short description
(English)
A caesium deposition system for FIB-SIMS chemical imaging
Abstract
(German)
The project will bring to commercial readiness a device to greatly increase the magnitude of signals from a secondary ion mass spectrometer mounted on a focused ion beam microscope. This will be achieved by depositing a layer of caesium on the sample within the vacuum system as measurements are carried out. Increased sensitivity  will enhance the sales of Tofwerk's existing FIB-SIMS product for chemical imaging at nano scales in three dimensions.
Abstract
(English)