High Throughput Power Semiconductor Dynamic Testing Methodology utilizing Self-Heating Principles

Research unit

INNOSUISSE

Project number

17033.1;4 INNO13-16-IW

Project title

High Throughput Power Semiconductor Dynamic Testing Methodology utilizing Self-Heating Principles

Texts for this project

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Short description (French)	High Throughput Power Semiconductor Dynamic Testing Methodology utilizing Self-Heating Principles