Fourier transformed atomic force microscopy for the rapid determination of surface properties with nanometer resolution (FT-SPM)

Research unit

INNOSUISSE

Project number

6351.1;7 KTS-NM

Project title

Fourier transformed atomic force microscopy for the rapid determination of surface properties with nanometer resolution (FT-SPM)

Texts for this project

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Short description (German)	Fourier transformed atomic force microscopy for the rapid determination of surface properties with nanometer resolution (FT-SPM)