PHILARIS / Probing by Heavy Ions and Lasers for an Assessment of Rad-hardness in Integrated Semiconductors.

Research unit

INNOSUISSE

Project number

110.374 INT-ENG

Project title

PHILARIS / Probing by Heavy Ions and Lasers for an Assessment of Rad-hardness in Integrated Semiconductors.

Texts for this project

	German	French	Italian	English
Key words	-	-	-
Abstract	-	-	-

Category	Text
Key words (English)	Engineering, Semi-conductors, Communication technologies, Micro processing
Abstract (English)	PHILARIS presents a promising alternative to costly rad-hardness assessment methods that depend on particle accelerators. By harnessing the power of lasers to mimic radiation-induced effects on integrated circuits, we unlock a new era of efficient and economically viable rad-hardness testing.