Quantum anomalous Hall effect materials and devices for metrology

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Unité de recherche

SEFRI

Numéro de projet

24.00226

Titre du projet

Quantum anomalous Hall effect materials and devices for metrology

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	Allemand	Français	Italien	Anglais
Résumé des résultats (Abstract)	-	-	-

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Résumé des résultats (Abstract) (Anglais)	The Quantum Hall effect (QHE) is the foundation for the realisation of the primaryresistance standard (PRS), representing the “gold standard” in electrical metrology. QHEdevices currently require low temperatures and high magnetic fields, impeding theiradoption beyond national metrology institutes. The Quantum anomalous Hall effect(QAHE) provides an opportunity to overcome these limitations, whilst maintaining theunsurpassed accuracy expected of PRS. Greater knowledge of QAHE devices isimportant to accelerate the development of a ‘quantum electrical metrology toolbox’ foruniversal adoption of quantum electrical SI standards. This project will grow, characterise,and evaluate thin films for QAHE, and devices fabricated from them leading to a detailedmetrological assessment from sub-K to above 1 K, currents from below 100 nA to above1 µA and over a wide range of external magnetic fields up to several Tesla.

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Texte

Résumé des résultats (Abstract)
(Anglais)

The Quantum Hall effect (QHE) is the foundation for the realisation of the primaryresistance standard (PRS), representing the “gold standard” in electrical metrology. QHEdevices currently require low temperatures and high magnetic fields, impeding theiradoption beyond national metrology institutes. The Quantum anomalous Hall effect(QAHE) provides an opportunity to overcome these limitations, whilst maintaining theunsurpassed accuracy expected of PRS. Greater knowledge of QAHE devices isimportant to accelerate the development of a ‘quantum electrical metrology toolbox’ foruniversal adoption of quantum electrical SI standards. This project will grow, characterise,and evaluate thin films for QAHE, and devices fabricated from them leading to a detailedmetrological assessment from sub-K to above 1 K, currents from below 100 nA to above1 µA and over a wide range of external magnetic fields up to several Tesla.