High speed, reflection free, micrometer resolution, multi source 3D image acquisition system for 3D automatic optical inspection (AOI) of electronic boards

Fonte Standard Gras
Identifiant

Unité de recherche

INNOSUISSE

Numéro de projet

41956.1 IP-ENG

Titre du projet

High speed, reflection free, micrometer resolution, multi source 3D image acquisition system for 3D automatic optical inspection (AOI) of electronic boards

Titre du projet anglais

High speed, reflection free, micrometer resolution, multi source 3D image acquisition system for 3D automatic optical inspection (AOI) of electronic boards

Textes relatifs à ce projet

	Allemand	Français	Italien	Anglais
Description succincte		-	-
Résumé des résultats (Abstract)		-	-	-

Textes saisis

Catégorie	Texte
Description succincte (Allemand)	High speed, reflection free, micrometer resolution, multi source 3D image acquisition system for 3D automatic optical inspection (AOI) of electronic boards
Description succincte (Anglais)	High speed, reflection free, micrometer resolution, multi source 3D image acquisition system for 3D automatic optical inspection (AOI) of electronic boards
Résumé des résultats (Abstract) (Allemand)	Current optical inspection systems require several ad-hoc machines to correctly detect errors.The goal is developing an innovative optical inspection head, which enables a single system to address all quality control needs.This will extremely improve efficiency and flexibility in production lines.