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Forschungsstelle
INNOSUISSE
Projektnummer
41956.1 IP-ENG
Projekttitel
High speed, reflection free, micrometer resolution, multi source 3D image acquisition system for 3D automatic optical inspection (AOI) of electronic boards
Projekttitel Englisch
High speed, reflection free, micrometer resolution, multi source 3D image acquisition system for 3D automatic optical inspection (AOI) of electronic boards

Texte zu diesem Projekt
 DeutschFranzösischItalienischEnglisch
Kurzbeschreibung
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Abstract
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Erfasste Texte


KategorieText
Kurzbeschreibung
(Deutsch)
High speed, reflection free, micrometer resolution, multi source 3D image acquisition system for 3D automatic optical inspection (AOI) of electronic boards
Kurzbeschreibung
(Englisch)
High speed, reflection free, micrometer resolution, multi source 3D image acquisition system for 3D automatic optical inspection (AOI) of electronic boards
Abstract
(Deutsch)
Current optical inspection systems require several ad-hoc machines to correctly detect errors.The goal is developing an innovative optical inspection head, which enables a single system to address all quality control needs.This will extremely improve efficiency and flexibility in production lines.