Atomic resolution at ambient conditions atomic force microscope (ARAC AFM)

• Unité de recherche: INNOSUISSE
• Numéro de projet: 25601.1 PFNM-NM
• Titre du projet anglais: Atomic resolution at ambient conditions atomic force microscope (ARAC AFM)

Description succincte (Allemand)

Atomic resolution at ambient conditions atomic force microscope (ARAC AFM)

Description succincte (Anglais)

Atomic resolution at ambient conditions atomic force microscope (ARAC AFM)

Résumé des résultats (Abstract) (Allemand)

An AFM will be developed, which easily and reliably provides atomic resolution at ambient conditions (ARAC AFM). To achieve this goal we use the so called qPlus sensor, which is by orders of magnitude more sensitive for operation on the atomic scale. It allows a more stable operation, resulting in a much greater ease of use than conventional AFM. The value of the technology is demonstrated by showing atomically resolved images of nanostructures and 2D materials.

Résumé des résultats (Abstract) (Anglais)

An AFM will be developed, which easily and reliably provides atomic resolution at ambient conditions (ARAC AFM). To achieve this goal we use the so called qPlus sensor, which is by orders of magnitude more sensitive for operation on the atomic scale. It allows a more stable operation, resulting in a much greater ease of use than conventional AFM. The value of the technology is demonstrated by showing atomically resolved images of nanostructures and 2D materials.