Atomic resolution at ambient conditions atomic force microscope (ARAC AFM)

• Forschungsstelle: INNOSUISSE
• Projektnummer: 25601.1 PFNM-NM
• Projekttitel Englisch: Atomic resolution at ambient conditions atomic force microscope (ARAC AFM)

Kurzbeschreibung (Deutsch)

Atomic resolution at ambient conditions atomic force microscope (ARAC AFM)

Kurzbeschreibung (Englisch)

Atomic resolution at ambient conditions atomic force microscope (ARAC AFM)

Abstract (Deutsch)

An AFM will be developed, which easily and reliably provides atomic resolution at ambient conditions (ARAC AFM). To achieve this goal we use the so called qPlus sensor, which is by orders of magnitude more sensitive for operation on the atomic scale. It allows a more stable operation, resulting in a much greater ease of use than conventional AFM. The value of the technology is demonstrated by showing atomically resolved images of nanostructures and 2D materials.

Abstract (Englisch)

An AFM will be developed, which easily and reliably provides atomic resolution at ambient conditions (ARAC AFM). To achieve this goal we use the so called qPlus sensor, which is by orders of magnitude more sensitive for operation on the atomic scale. It allows a more stable operation, resulting in a much greater ease of use than conventional AFM. The value of the technology is demonstrated by showing atomically resolved images of nanostructures and 2D materials.