AFM based fast Scanning Ion Conductance Microscopy: True contactless nanoscale imaging of biological samples

Forschungsstelle

INNOSUISSE

Projektnummer

18330.1 PFNM-NM

Projekttitel

AFM based fast Scanning Ion Conductance Microscopy: True contactless nanoscale imaging of biological samples

Projekttitel Englisch

AFM based fast SICM: True contactless nanoscale imaging of biological samples

Texte zu diesem Projekt

	Deutsch	Französisch	Italienisch	Englisch
Kurzbeschreibung		-	-
Abstract		-	-

Kategorie	Text
Kurzbeschreibung (Deutsch)	AFM based fast Scanning Ion Conductance Microscopy: True contactless nanoscale imaging of biological samples
Kurzbeschreibung (Englisch)	AFM based fast SICM: True contactless nanoscale imaging of biological samples
Abstract (Deutsch)	A new Scanning Ion Conductance Microscopy (SICM) method will be developed that is based on AFM and hollow cantilevers. Compared to conventional SICM it is more than 10 times faster and much easier to use. For the first time a commercial AFM can be offered for contact free imaging of living cells with nanometer resolution, under physiological conditions. This allows for example the study of stem cell differentiation, bacterial growth and cell motility.
Abstract (Englisch)	A new Scanning Ion Conductance Microscopy (SICM) method will be developed that is based on AFM and hollow cantilevers. Compared to conventional SICM it is more than 10 times faster and much easier to use. For the first time a commercial AFM can be offered for contact free imaging of living cells with nanometer resolution, under physiological conditions. This allows for example the study of stem cell differentiation, bacterial growth and cell motility.