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Research unit
INNOSUISSE
Project number
13609.1;4 PFFLE-ES
Project title
Next-Gen USB3.0 Protocol Test & Analysis System

Texts for this project
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Short description
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Abstract
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Inserted texts


CategoryText
Short description
(English)
Next-Gen USB3.0 Protocol Test & Analysis System
Short description
(French)
Next-Gen USB3.0 Protocol Test & Analysis System
Abstract
(English)
Development of Ellisys¿ next generation USB 3.0 Protocol Test & Analysis System. The project includes R&D for novel hardware and innovative features (inline error injection, advanced triggers, dual-mode traffic generation), not supplied by any competitor. The product based on this project will be suitable to current and future market¿s needs. It will let Ellisys keep its leading position on the USB 3.0 IC test market, and capture a dominant share of the upcoming USB 3.0 CE test market.
Abstract
(French)
Development of Ellisys¿ next generation USB 3.0 Protocol Test & Analysis System. The project includes R&D for novel hardware and innovative features (inline error injection, advanced triggers, dual-mode traffic generation), not supplied by any competitor. The product based on this project will be suitable to current and future market¿s needs. It will let Ellisys keep its leading position on the USB 3.0 IC test market, and capture a dominant share of the upcoming USB 3.0 CE test market.