Next-Gen USB3.0 Protocol Test & Analysis System

• Unité de recherche: INNOSUISSE
• Numéro de projet: 13609.1;4 PFFLE-ES
• Titre du projet anglais: Next-Gen USB3.0 Protocol Test & Analysis System

Description succincte (Anglais)

Next-Gen USB3.0 Protocol Test & Analysis System

Description succincte (Français)

Next-Gen USB3.0 Protocol Test & Analysis System

Résumé des résultats (Abstract) (Anglais)

Development of Ellisys¿ next generation USB 3.0 Protocol Test & Analysis System. The project includes R&D for novel hardware and innovative features (inline error injection, advanced triggers, dual-mode traffic generation), not supplied by any competitor. The product based on this project will be suitable to current and future market¿s needs. It will let Ellisys keep its leading position on the USB 3.0 IC test market, and capture a dominant share of the upcoming USB 3.0 CE test market.

Résumé des résultats (Abstract) (Français)

Development of Ellisys¿ next generation USB 3.0 Protocol Test & Analysis System. The project includes R&D for novel hardware and innovative features (inline error injection, advanced triggers, dual-mode traffic generation), not supplied by any competitor. The product based on this project will be suitable to current and future market¿s needs. It will let Ellisys keep its leading position on the USB 3.0 IC test market, and capture a dominant share of the upcoming USB 3.0 CE test market.