Dedicated Electrochemical Atomic Force Microscopy (DEAFM) ¿ a method to measure local chemical processes in the nanometer range.

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Identifiant

Unité de recherche

INNOSUISSE

Numéro de projet

13696.1;5 PFFLR-IW

Titre du projet

Dedicated Electrochemical Atomic Force Microscopy (DEAFM) ¿ a method to measure local chemical processes in the nanometer range.

Titre du projet anglais

Dedicated Electrochemical Atomic Force Microscopy (DEAFM) ¿ a method to measure local chemical processes in the nanometer range.

Textes relatifs à ce projet

	Allemand	Français	Italien	Anglais
Description succincte	-	-	-
Résumé des résultats (Abstract)	-	-	-

Textes saisis

Catégorie	Texte
Description succincte (Anglais)	Dedicated Electrochemical Atomic Force Microscopy (DEAFM) ¿ a method to measure local chemical processes in the nanometer range.
Résumé des résultats (Abstract) (Anglais)	New developments in fuel-cells, photo voltaic or thin film coatings, and plating applications require nm-resolved techniques to perform and image local electrochemical processes in order to increase systemperformance and reliability. For this growing market need a dedicated electrochemical atomic forcemicroscope (EC-AFM) is developed which will put Nanosurf into the technological market leader position in afast growing market.

Catégorie

Texte

Description succincte
(Anglais)

Dedicated Electrochemical Atomic Force Microscopy (DEAFM) ¿ a method to measure local chemical processes in the nanometer range.

Résumé des résultats (Abstract)
(Anglais)

New developments in fuel-cells, photo voltaic or thin film coatings, and plating applications require nm-resolved techniques to perform and image local electrochemical processes in order to increase systemperformance and reliability. For this growing market need a dedicated electrochemical atomic forcemicroscope (EC-AFM) is developed which will put Nanosurf into the technological market leader position in afast growing market.