Dedicated Electrochemical Atomic Force Microscopy (DEAFM) ¿ a method to measure local chemical processes in the nanometer range.

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INNOSUISSE

Project number

13696.1;5 PFFLR-IW

Project title

Dedicated Electrochemical Atomic Force Microscopy (DEAFM) ¿ a method to measure local chemical processes in the nanometer range.

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Short description (English)	Dedicated Electrochemical Atomic Force Microscopy (DEAFM) ¿ a method to measure local chemical processes in the nanometer range.
Abstract (English)	New developments in fuel-cells, photo voltaic or thin film coatings, and plating applications require nm-resolved techniques to perform and image local electrochemical processes in order to increase systemperformance and reliability. For this growing market need a dedicated electrochemical atomic forcemicroscope (EC-AFM) is developed which will put Nanosurf into the technological market leader position in afast growing market.

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Text

Short description
(English)

Dedicated Electrochemical Atomic Force Microscopy (DEAFM) ¿ a method to measure local chemical processes in the nanometer range.

Abstract
(English)

New developments in fuel-cells, photo voltaic or thin film coatings, and plating applications require nm-resolved techniques to perform and image local electrochemical processes in order to increase systemperformance and reliability. For this growing market need a dedicated electrochemical atomic forcemicroscope (EC-AFM) is developed which will put Nanosurf into the technological market leader position in afast growing market.