Dedicated Electrochemical Atomic Force Microscopy (DEAFM) ¿ a method to measure local chemical processes in the nanometer range.

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Projektnummer

13696.1;5 PFFLR-IW

Projekttitel

Dedicated Electrochemical Atomic Force Microscopy (DEAFM) ¿ a method to measure local chemical processes in the nanometer range.

Projekttitel Englisch

Dedicated Electrochemical Atomic Force Microscopy (DEAFM) ¿ a method to measure local chemical processes in the nanometer range.

Texte zu diesem Projekt

	Deutsch	Französisch	Italienisch	Englisch
Kurzbeschreibung	-	-	-
Abstract	-	-	-

Erfasste Texte

Kategorie	Text
Kurzbeschreibung (Englisch)	Dedicated Electrochemical Atomic Force Microscopy (DEAFM) ¿ a method to measure local chemical processes in the nanometer range.
Abstract (Englisch)	New developments in fuel-cells, photo voltaic or thin film coatings, and plating applications require nm-resolved techniques to perform and image local electrochemical processes in order to increase systemperformance and reliability. For this growing market need a dedicated electrochemical atomic forcemicroscope (EC-AFM) is developed which will put Nanosurf into the technological market leader position in afast growing market.

Kategorie

Text

Kurzbeschreibung
(Englisch)

Dedicated Electrochemical Atomic Force Microscopy (DEAFM) ¿ a method to measure local chemical processes in the nanometer range.

Abstract
(Englisch)

New developments in fuel-cells, photo voltaic or thin film coatings, and plating applications require nm-resolved techniques to perform and image local electrochemical processes in order to increase systemperformance and reliability. For this growing market need a dedicated electrochemical atomic forcemicroscope (EC-AFM) is developed which will put Nanosurf into the technological market leader position in afast growing market.