DAK-TL: Instrumentation System for Rapid, High-Precision Dielectric Characterization of Thin-Layer Materials

• Unité de recherche: INNOSUISSE
• Numéro de projet: 13320.1;3 PFFLI-IW
• Titre du projet anglais: DAK-TL: Instrumentation System for Rapid, High-Precision Dielectric Characterization of Thin-Layer Materials

Description succincte (Allemand)

DAK-TL: Instrumentation System for Rapid, High-Precision Dielectric Characterization of Thin-Layer Materials

Description succincte (Anglais)

DAK-TL: Instrumentation System for Rapid, High-Precision Dielectric Characterization of Thin-Layer Materials

Résumé des résultats (Abstract) (Allemand)

Instrumentation to characterize material dielectric properties at microwave frequencies is increasingly needed by industry. The IT¿IS Foundation and SPEAG have developed a high-precision instrument (DAK) that operates in large enough samples of liquids and solids to avoid boundary effects. The objective of this project is to develop advanced algorithms and procedures for applying DAK probes to thin layers for rapid measurements with reduced sample preparation time and cost.

Résumé des résultats (Abstract) (Anglais)

Instrumentation to characterize material dielectric properties at microwave frequencies is increasingly needed by industry. The IT¿IS Foundation and SPEAG have developed a high-precision instrument (DAK) that operates in large enough samples of liquids and solids to avoid boundary effects. The objective of this project is to develop advanced algorithms and procedures for applying DAK probes to thin layers for rapid measurements with reduced sample preparation time and cost.