DAK-TL: Instrumentation System for Rapid, High-Precision Dielectric Characterization of Thin-Layer Materials - Texts

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Research unit

INNOSUISSE

Project number

13320.1;3 PFFLI-IW

Project title

DAK-TL: Instrumentation System for Rapid, High-Precision Dielectric Characterization of Thin-Layer Materials

Texts for this project

	German	French	Italian	English
Short description		-	-
Abstract		-	-

Inserted texts

Category	Text
Short description (German)	DAK-TL: Instrumentation System for Rapid, High-Precision Dielectric Characterization of Thin-Layer Materials
Short description (English)	DAK-TL: Instrumentation System for Rapid, High-Precision Dielectric Characterization of Thin-Layer Materials
Abstract (German)	Instrumentation to characterize material dielectric properties at microwave frequencies is increasingly needed by industry. The IT¿IS Foundation and SPEAG have developed a high-precision instrument (DAK) that operates in large enough samples of liquids and solids to avoid boundary effects. The objective of this project is to develop advanced algorithms and procedures for applying DAK probes to thin layers for rapid measurements with reduced sample preparation time and cost.
Abstract (English)	Instrumentation to characterize material dielectric properties at microwave frequencies is increasingly needed by industry. The IT¿IS Foundation and SPEAG have developed a high-precision instrument (DAK) that operates in large enough samples of liquids and solids to avoid boundary effects. The objective of this project is to develop advanced algorithms and procedures for applying DAK probes to thin layers for rapid measurements with reduced sample preparation time and cost.