Development of a high mass resolution secondary ion mass spectrometer as an accessory for focused ion beam instruments

• Unité de recherche: INNOSUISSE
• Numéro de projet: 13300.1;6 PFFLM-NM
• Titre du projet anglais: Development of a high mass resolution secondary ion mass spectrometer as an accessory for focused ion beam instruments

Description succincte (Allemand)

Development of a high mass resolution secondary ion mass spectrometer as an accessory for focused ion beam instruments

Description succincte (Anglais)

Development of a high mass resolution secondary ion mass spectrometer as an accessory for focused ion beam instruments

Résumé des résultats (Abstract) (Allemand)

Users of focused ion beams (FIBs) and SEM/FIB instruments require chemical or isotopic information that can not be obtained using techniques such as EDX or MALDI because the spatial scale is too small or the specificity or sensitivity insufficient. Secondary ion mass spectrometry can address this demand, but is very expensive; we will change this by introducing a high-performance SIMS module similar in footprint and physical interface requirements to an EDX module. One potential market for this instrument is the study of labeled tissue sections.

Résumé des résultats (Abstract) (Anglais)

Users of focused ion beams (FIBs) and SEM/FIB instruments require chemical or isotopic information that can not be obtained using techniques such as EDX or MALDI because the spatial scale is too small or the specificity or sensitivity insufficient. Secondary ion mass spectrometry can address this demand, but is very expensive; we will change this by introducing a high-performance SIMS module similar in footprint and physical interface requirements to an EDX module. One potential market for this instrument is the study of labeled tissue sections.