Scattering parameters (S-parameters) are important and fundamental quantities in RF & Microwave metrology. The determination of other RF & MW quantities is quite often dependent on the knowledge of the S-parameters of the system. S-parameters are measured with vector network analyzers (VNA), which are calibrated to a reference impedance (50 Ohm) beforehand. The measured quantities are primarily traceable to dimensional quantities. Traceability and measurement involve complex procedures and set high demands regarding the consideration of all influences, as e.g. deviations from ideal geometry, and regarding the calculation of the measurement uncertainties.
This project is a follow up of the projects CoMo70 „Connector Modelling up to 70 GHz“ (5217.06.FP.045) and VNA Tools II “GUM based uncertainty calculation for the vector network analyzer” (5217.08.FP.060). CoMo70 results implicate that the connector interface can indeed have a significant influence in high accuracy measurements not only at high frequencies. Based on these insights this project aims at the transfer of Como70 results into metrological practice with the help of the VNA Tools II software and at the extension of the CoMo70 work to other coaxial connector types than the 1.85 mm connector. These are the necessary steps to control connector effects in RF & MW measurements over a wide range of frequencies and to enhance the related measurement services at METAS in an efficient way.
Industry has a vital interest in the outcomes of this project, which has an impact on the design, the characterization and the tolerancing of connector interfaces of RF & MW components.
