SPIN-POLARIZED FIELD EMISSION SCANNING ELECTRON MICROSCOPE AND SECONDARY ELECTRON POLARIZATION ANALYSIS

• Unité de recherche: INNOSUISSE
• Numéro de projet: 9860.1;4 PFNM-NM
• Titre du projet anglais: SPIN-POLARIZED FIELD EMISSION SCANNING ELECTRON MICROSCOPE AND SECONDARY ELECTRON POLARIZATION ANALYSIS

Description succincte (Allemand)

SPIN-POLARIZED FIELD EMISSION SCANNING ELECTRON MICROSCOPE AND SECONDARY ELECTRON POLARIZATION ANALYSIS

Description succincte (Anglais)

SPIN-POLARIZED FIELD EMISSION SCANNING ELECTRON MICROSCOPE AND SECONDARY ELECTRON POLARIZATION ANALYSIS

Résumé des résultats (Abstract) (Allemand)

The project relates to a cost-efficient electron microscope capable of imaging the top-most layers of surfaces with high spatial resolution. In addition, a spin detector will be incorporated into the system for polarization analysis.

Résumé des résultats (Abstract) (Anglais)

The project relates to a cost-efficient electron microscope capable of imaging the top-most layers of surfaces with high spatial resolution. In addition, a spin detector will be incorporated into the system for polarization analysis.