SPIN-POLARIZED FIELD EMISSION SCANNING ELECTRON MICROSCOPE AND SECONDARY ELECTRON POLARIZATION ANALYSIS - Texts

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Research unit

INNOSUISSE

Project number

9860.1;4 PFNM-NM

Project title

SPIN-POLARIZED FIELD EMISSION SCANNING ELECTRON MICROSCOPE AND SECONDARY ELECTRON POLARIZATION ANALYSIS

Texts for this project

	German	French	Italian	English
Short description		-	-
Abstract		-	-

Inserted texts

Category	Text
Short description (German)	SPIN-POLARIZED FIELD EMISSION SCANNING ELECTRON MICROSCOPE AND SECONDARY ELECTRON POLARIZATION ANALYSIS
Short description (English)	SPIN-POLARIZED FIELD EMISSION SCANNING ELECTRON MICROSCOPE AND SECONDARY ELECTRON POLARIZATION ANALYSIS
Abstract (German)	The project relates to a cost-efficient electron microscope capable of imaging the top-most layers of surfaces with high spatial resolution. In addition, a spin detector will be incorporated into the system for polarization analysis.
Abstract (English)	The project relates to a cost-efficient electron microscope capable of imaging the top-most layers of surfaces with high spatial resolution. In addition, a spin detector will be incorporated into the system for polarization analysis.