SPIN-POLARIZED FIELD EMISSION SCANNING ELECTRON MICROSCOPE AND SECONDARY ELECTRON POLARIZATION ANALYSIS

Forschungsstelle

INNOSUISSE

Projektnummer

9860.1;4 PFNM-NM

Projekttitel

SPIN-POLARIZED FIELD EMISSION SCANNING ELECTRON MICROSCOPE AND SECONDARY ELECTRON POLARIZATION ANALYSIS

Projekttitel Englisch

SPIN-POLARIZED FIELD EMISSION SCANNING ELECTRON MICROSCOPE AND SECONDARY ELECTRON POLARIZATION ANALYSIS

Texte zu diesem Projekt

	Deutsch	Französisch	Italienisch	Englisch
Kurzbeschreibung		-	-
Abstract		-	-

Kategorie	Text
Kurzbeschreibung (Deutsch)	SPIN-POLARIZED FIELD EMISSION SCANNING ELECTRON MICROSCOPE AND SECONDARY ELECTRON POLARIZATION ANALYSIS
Kurzbeschreibung (Englisch)	SPIN-POLARIZED FIELD EMISSION SCANNING ELECTRON MICROSCOPE AND SECONDARY ELECTRON POLARIZATION ANALYSIS
Abstract (Deutsch)	The project relates to a cost-efficient electron microscope capable of imaging the top-most layers of surfaces with high spatial resolution. In addition, a spin detector will be incorporated into the system for polarization analysis.
Abstract (Englisch)	The project relates to a cost-efficient electron microscope capable of imaging the top-most layers of surfaces with high spatial resolution. In addition, a spin detector will be incorporated into the system for polarization analysis.