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Unité de recherche
INNOSUISSE
Numéro de projet
9800.1;7 PFNM-NM
Titre du projet
VCSELs emitting in the 1500 nm - 2000 nm band for low-cost, portable gas-sensing systems
Titre du projet anglais
VCSELs emitting in the 1500 nm - 2000 nm band for low-cost, portable gas-sensing systems

Textes relatifs à ce projet

 AllemandFrançaisItalienAnglais
Description succincte
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Résumé des résultats (Abstract)
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Textes saisis


CatégorieTexte
Description succincte
(Anglais)
VCSELs emitting in the 1500 nm - 2000 nm band for low-cost, portable gas-sensing systems
Description succincte
(Français)
VCSELs emitting in the 1500 nm - 2000 nm band for low-cost, portable gas-sensing systems
Résumé des résultats (Abstract)
(Anglais)
The project will develop long wavelength (1500-2000nm) vertical cavity surface emitting lasers (VCSELs) with precisely controlled emission wavelength (± 1nm) for low-cost, portable gas sensing applications at 1512 nm, 1953 nm and 2004 nm. This will be accomplished by the optimization of the device design of VCSELs emitting in the vicinity of 2000 nm, decreasing the sensitivity to back reflections as a result of device design and packaging optimization. The developed VCSELs will be employed in the elaboration of low-cost, portable, gas sensing systems for selected molecules using the novel optical detection method developed at IR Microsystems, which is currently a Leister company.
Résumé des résultats (Abstract)
(Français)
The project will develop long wavelength (1500-2000nm) vertical cavity surface emitting lasers (VCSELs) with precisely controlled emission wavelength (± 1nm) for low-cost, portable gas sensing applications at 1512 nm, 1953 nm and 2004 nm. This will be accomplished by the optimization of the device design of VCSELs emitting in the vicinity of 2000 nm, decreasing the sensitivity to back reflections as a result of device design and packaging optimization. The developed VCSELs will be employed in the elaboration of low-cost, portable, gas sensing systems for selected molecules using the novel optical detection method developed at IR Microsystems, which is currently a Leister company.